Intel Describes Its Second Generation Silicon Spin Test Chip
At the 2022 Silicon Quantum Electronics Workshop in Orford, Québec, Canada, Intel described its second generation silicon spin test chip and some results in testing it. In the chip business yield is everything and Intel announced that they achieved a yield rate of about 95% across the 300 millimeter wafer in a recent test. You might ask whether […]
The post Intel Describes Its Second Generation Silicon Spin Test Chip appeared first on Quantum Computing Report.
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