A scanning quantum sensing microscope with nanoscale electric-field imaging

Recently, Professor Jiang Ying from International Center for Quantum Materials and Research Center for Light-Element Advanced Materials of Peking University, in collaboration with Professor Jörg Wrachtrup from Stuttgart University and Professor Yang Sen from the Chinese University of Hong Kong, has developed a scanning quantum sensing microscope by using a solid-state quantum bit (qubit), nitrogen-vacancy (NV) center, as the quantum sensor. They have, for the first time, realized NV-based nanoscale electric-field imaging and its charge-state control, demonstrating the possibility of scanning NV electrometry. This work, titled “Nanoscale electric-field imaging based on a quantum sensor and its charge-state control under ambient condition,” has been published in Nature Communications.