Oxford University Demonstrates Record-Low Single-Qubit Gate Error Using Microwave-Controlled Calcium Ions

Researchers at the University of Oxford have reported a new benchmark for single-qubit gate fidelity using trapped-ion technology, achieving an error rate of just 0.000015%—equivalent to one error in 6.7 million operations. The result is scheduled for publication in Physical Review Letters and represents an order-of-magnitude improvement over the group’s own prior record set in […]

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